X-Ray Fluorescence Spectroscopy for Laboratory Applications

X-Ray Fluorescence Spectroscopy for Laboratory Applications
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Provides comprehensive coverage  on using X-ray fluorescence for laboratory applications   This book focuses on the practical aspects of X-ray fluorescence (XRF) spectroscopy and discusses the requirements for a successful sample analysis, such as sample preparation, measurement techniques and calibration, as well as the quality of the analysis results.  X-Ray Fluorescence Spectroscopy for Laboratory Applications  begins with a short overview of the physical fundamentals of the generation of  X -rays and their interaction with the sample material, followed by a presentation of the different methods of sample preparation in dependence on the quality of the source material and the objective of the measurement. After a short description of the different available equipment types and their respective performance, the book provides in-depth information on the choice of the optimal measurement conditions and the processing of the measurement results. It covers instrument types for XRF; acquisition and evaluation of X-Ray spectra; analytical errors; analysis of homogeneous materials, powders, and liquids; special applications of XRF; process control and automation.  An important resource for the analytical chemist, providing concrete guidelines and support for everyday analyses Focuses on daily laboratory work with commercially available devices Offers a unique compilation of knowledge and best practices from equipment manufacturers and users Covers the entire work process: sample preparation, the actual measurement, data processing, assessment of uncertainty, and accuracy of the obtained results  X-Ray Fluorescence Spectroscopy for Laboratory Applications  appeals to analytical chemists, analytical laboratories, materials scientists, environmental chemists, chemical engineers, biotechnologists, and pharma engineers.

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Jörg Flock. X-Ray Fluorescence Spectroscopy for Laboratory Applications

Table of Contents

List of Tables

List of Illustrations

Guide

Pages

X-ray Fluorescence Spectroscopy for Laboratory Applications

Preface

List of Abbreviations and Symbols

About the Authors

1 Introduction

2 Principles of X-ray Spectrometry. 2.1 Analytical Performance

2.2 X-ray Radiation and Their Interaction. 2.2.1 Parts of an X-ray Spectrum

2.2.2 Intensity of the Characteristic Radiation

2.2.3 Nomenclature of X-ray Lines

2.2.4 Interaction of X-rays with Matter

2.2.4.1 Absorption

2.2.4.2 Scattering

2.2.5 Detection of X-ray Spectra

2.3 The Development of X-ray Spectrometry

2.4 Carrying Out an Analysis. 2.4.1 Analysis Method

2.4.2 Sequence of an Analysis

2.4.2.1 Quality of the Sample Material

2.4.2.2 Sample Preparation

2.4.2.3 Analysis Task

2.4.2.4 Measurement and Evaluation of the Measurement Data

2.4.2.5 Creation of an Analysis Report

3 Sample Preparation. 3.1 Objectives of Sample Preparation

3.2 Preparation Techniques. 3.2.1 Preparation Techniques for Solid Samples

3.2.2 Information Depth and Analyzed Volume

3.2.3 Infinite Thickness

3.2.4 Contaminations

3.2.5 Homogeneity

3.3 Preparation of Compact and Homogeneous Materials. 3.3.1 Metals

3.3.2 Glasses

3.4 Small Parts Materials

3.4.1 Grinding of Small Parts Material

3.4.2 Preparation by Pouring Loose Powder into a Sample Cup

3.4.3 Preparation of the Measurement Sample by Pressing into a Pellet

3.4.4 Preparation of the Sample by Fusion Beads. 3.4.4.1 Improving the Quality of the Analysis

3.4.4.2 Steps for the Production of Fusion Beads

3.4.4.3 Loss of Ignition

3.4.4.4 Quality Criteria for Fusion Beads

3.4.4.5 Preparation of Special Materials

3.5 Liquid Samples

3.5.1 Direct Measurement of Liquids

3.5.2 Special Processing Procedures for Liquid Samples

3.6 Biological Materials

3.7 Small Particles, Dust, and Aerosols

4 XRF Instrument Types. 4.1 General Design of an X-ray Spectrometer

4.2 Comparison of Wavelength- and Energy-Dispersive X-Ray Spectrometers

4.2.1 Data Acquisition

4.2.2 Resolution

4.2.2.1 Comparison of Wavelength- and Energy-Dispersive Spectrometry

4.2.2.2 Resolution of WDS Instruments

4.2.2.3 Resolution of EDS Instruments

4.2.3 Detection Efficiency

4.2.4 Count Rate Capability

4.2.4.1 Optimum Throughput in ED Spectrometers

4.2.4.2 Saturation Effects in WDSs

4.2.4.3 Optimal Sensitivity of ED Spectrometers

4.2.4.4 Effect of the Pulse Throughput on the Measuring Time

4.2.5 Radiation Flux

4.2.6 Spectra Artifacts

4.2.6.1 Escape Peaks

4.2.6.2 Pile-Up Peak

4.2.6.3 Diffraction Peaks

4.2.6.4 Shelf and Tail

4.2.7 Mechanical Design and Operating Costs

4.2.8 Setting Parameters

4.3 Type of Instruments

4.3.1 ED Instruments

4.3.1.1 Handheld Instruments

4.3.1.2 Portable Instruments

4.3.1.3 Tabletop Instruments

4.3.2 Wavelength-Dispersive Instruments. 4.3.2.1 Sequential Spectrometers

4.3.2.2 Multichannel Spectrometers

4.3.3 Special Type X-Ray Spectrometers

4.3.3.1 Total Reflection Instruments

4.3.3.2 Excitation by Monoenergetic Radiation

4.3.3.3 Excitation with Polarized Radiation

4.3.3.4 Instruments for Position-Sensitive Analysis

4.3.3.5 Macro X-Ray Fluorescence Spectrometer

4.3.3.6 Micro X-Ray Fluorescence with Confocal Geometry

4.3.3.7 High-Resolution X-Ray Spectrometers

4.3.3.8 Angle Resolved Spectroscopy – Grazing Incidence and Grazing Exit

4.4 Commercially Available Instrument Types

5 Measurement and Evaluation of X-ray Spectra. 5.1 Information Content of the Spectra

5.2 Procedural Steps to Execute a Measurement

5.3 Selecting the Measurement Conditions. 5.3.1 Optimization Criteria for the Measurement

5.3.2 Tube Parameters

5.3.2.1 Target Material

5.3.2.2 Excitation Conditions

5.3.2.3 Influencing the Energy Distribution of the Primary Spectrum

5.3.3 Measurement Medium

5.3.4 Measurement Time. 5.3.4.1 Measurement Time and Statistical Error

5.3.4.2 Measurement Strategies

5.3.4.3 Real and Live Time

5.3.5 X-ray Lines

5.4 Determination of Peak Intensity

5.4.1 Intensity Data

5.4.2 Treatment of Peak Overlaps

5.4.3 Spectral Background

5.5 Quantification Models. 5.5.1 General Remarks

5.5.2 Conventional Calibration Models

5.5.3 Fundamental Parameter Models

5.5.4 Monte Carlo Quantifications

5.5.5 Highly Precise Quantification by Reconstitution

5.5.6 Evaluation of an Analytical Method

5.5.6.1 Degree of Determination

5.5.6.2 Working Range, Limits of Detection (LOD) and of Quantification

5.5.6.3 Figure of Merit

5.5.7 Comparison of the Various Quantification Models

5.5.8 Available Reference Materials

5.5.9 Obtainable Accuracies

5.6 Characterization of Layered Materials. 5.6.1 General Form of the Calibration Curve

5.6.2 Basic Conditions for Layer Analysis

5.6.3 Quantification Models for the Analysis of Layers

5.7 Chemometric Methods for Material Characterization

5.7.1 Spectra Matching and Material Identification

5.7.2 Phase Analysis

5.7.3 Regression Methods

5.8 Creation of an Application

5.8.1 Analysis of Unknown Sample Qualities

5.8.2 Repeated Analyses on Known Samples

6 Analytical Errors

6.1 General Considerations

6.1.1 Precision of a Measurement

6.1.2 Long-Term Stability of the Measurements

6.1.3 Precision and Process Capability

6.1.4 Trueness of the Result

6.2 Types of Errors

6.2.1 Randomly Distributed Errors

6.2.2 Systematic Errors

6.3 Accounting for Systematic Errors

6.3.1 The Concept of Measurement Uncertainties

6.3.2 Error Propagation

6.3.3 Determination of Measurement Uncertainties

6.3.3.1 Bottom-Up Method

6.3.3.2 Top-Down Method

6.4 Recording of Error Information

7 Other Element Analytical Methods. 7.1 Overview

7.2 Atomic Absorption Spectrometry (AAS)

7.3 Optical Emission Spectrometry

7.3.1 Excitation with a Spark Discharge (OES)

7.3.2 Excitation in an Inductively Coupled Plasma (ICP-OES)

7.3.3 Laser-Induced Breakdown Spectroscopy (LIBS)

7.4 Mass Spectrometry (MS)

7.5 X-Ray Spectrometry by Particle Excitation (SEM-EDS, PIXE)

7.6 Comparison of Methods

8 Radiation Protection. 8.1 Basic Principles

8.2 Effects of Ionizing Radiation on Human Tissue

8.3 Natural Radiation Exposure

8.4 Radiation Protection Regulations. 8.4.1 Legal Regulations

9 Analysis of Homogeneous Solid Samples

9.1 Iron Alloys

9.1.1 Analytical Problem and Sample Preparation

9.1.2 Analysis of Pig and Cast Iron

9.1.3 Analysis of Low-Alloy Steel

9.1.4 Analysis of High-Alloy Steel

9.2 Ni–Fe–Co Alloys

9.3 Copper Alloys. 9.3.1 Analytical Task

9.3.2 Analysis of Compact Samples

9.3.3 Analysis of Dissolved Samples

9.4 Aluminum Alloys

9.5 Special Metals. 9.5.1 Refractories. 9.5.1.1 Analytical Problem

9.5.1.2 Sample Preparation of Hard Metals

9.5.1.3 Analysis of Hard Metals

9.5.2 Titanium Alloys

9.5.3 Solder Alloys

9.6 Precious Metals. 9.6.1 Analysis of Precious Metal Jewelry. 9.6.1.1 Analytical Task

9.6.1.2 Sample Shape and Preparation

9.6.1.3 Analytical Equipment

9.6.1.4 Accuracy of the Analysis

9.6.2 Analysis of Pure Elements

9.7 Glass Material. 9.7.1 Analytical Task

9.7.2 Sample Preparation

9.7.3 Measurement Equipment

9.7.4 Achievable Accuracies

9.8 Polymers. 9.8.1 Analytical Task

9.8.2 Sample Preparation

9.8.3 Instruments

9.8.4 Quantification Procedures. 9.8.4.1 Standard-Based Methods

9.8.4.2 Chemometric Methods

9.9 Abrasion Analysis

10 Analysis of Powder Samples

10.1 Geological Samples. 10.1.1 Analytical Task

10.1.2 Sample Preparation

10.1.3 Measurement Technique

10.1.4 Detection Limits and Trueness

10.2 Ores. 10.2.1 Analytical Task

10.2.2 Iron Ores

10.2.3 Mn, Co, Ni, Cu, Zn, and Pb Ores

10.2.4 Bauxite and Alumina

10.2.5 Ores of Precious Metals and Rare Earths

10.3 Soils and Sewage Sludges. 10.3.1 Analytical Task

10.3.2 Sample Preparation

10.3.3 Measurement Technology and Analytical Performance

10.4 Quartz Sand

10.5 Cement. 10.5.1 Analytical Task

10.5.2 Sample Preparation

10.5.3 Measurement Technology

10.5.4 Analytical Performance

10.5.5 Determination of Free Lime in Clinker

10.6 Coal and Coke. 10.6.1 Analytical Task

10.6.2 Sample Preparation

10.6.3 Measurement Technology and Analytical Performance

10.7 Ferroalloys. 10.7.1 Analytical Task

10.7.2 Sample Preparation

10.7.3 Analysis Technology

10.7.4 Analytical Performance

10.8 Slags. 10.8.1 Analytical Task

10.8.2 Sample Preparation

10.8.3 Measurement Technology and Analytical Accuracy

10.9 Ceramics and Refractory Materials. 10.9.1 Analytical Task

10.9.2 Sample Preparation

10.9.3 Measurement Technology and Analytical Performance

10.10 Dusts

10.10.1 Analytical Problem and Dust Collection

10.10.2 Measurement

10.11 Food. 10.11.1 Analytical Task

10.11.2 Monitoring of Animal Feed

10.11.3 Control of Infant Food

10.12 Pharmaceuticals. 10.12.1 Analytical Task

10.12.2 Sample Preparation and Analysis Method

10.13 Secondary Fuels. 10.13.1 Analytical Task

10.13.2 Sample Preparation. 10.13.2.1 Solid Secondary Raw Materials

10.13.2.2 Liquid Secondary Raw Materials

10.13.3 Instrumentation and Measurement Conditions

10.13.4 Measurement Uncertainties in the Analysis of Solid Secondary Raw Materials

10.13.5 Measurement Uncertainties for the Analysis of Liquid Secondary Raw Materials

11 Analysis of Liquids

11.1 Multielement Analysis of Liquids. 11.1.1 Analytical Task

11.1.2 Sample Preparation

11.1.3 Measurement Technology

11.1.4 Quantification

11.2 Fuels and Oils

11.2.1 Analysis of Toxic Elements in Fuels

11.2.1.1 Measurement Technology

11.2.1.2 Analytical Performance

11.2.2 Analysis of Additives in Lubricating Oils

11.2.3 Identification of Abrasive Particles in Used Lubricants

11.3 Trace Analysis in Liquids. 11.3.1 Analytical Task

11.3.2 Preparation by Drying

11.3.3 Quantification

11.4 Special Preparation Techniques for Liquid Samples. 11.4.1 Determination of Light Elements in Liquids

11.4.2 Enrichment Through Absorption and Complex Formation

12 Trace Analysis Using Total Reflection X-Ray Fluorescence. 12.1 Special Features of TXRF

12.2 Sample Preparation for TXRF

12.3 Evaluation of the Spectra. 12.3.1 Spectrum Preparation and Quantification

12.3.2 Conditions for Neglecting the Matrix Interaction

12.3.3 Limits of Detection

12.4 Typical Applications of the TXRF

12.4.1 Analysis of Aqueous Solutions. 12.4.1.1 Analytical Problem and Preparation Possibilities

12.4.1.2 Example: Analysis of a Fresh Water Standard Sample

12.4.1.3 Example: Detection of Mercury in Water

12.4.2 Analysis of the Smallest Sample Quantities. 12.4.2.1 Example: Pigment Analysis

12.4.2.2 Example: Aerosol Analysis

12.4.2.3 Example: Analysis of Nanoparticles

12.4.3 Trace Element Analysis on Human Organs. 12.4.3.1 Example: Analysis of Blood and Blood Serum

12.4.3.2 Example: Analysis of Trace Elements in Body Tissue

12.4.4 Trace Analysis of Inorganic and Organic Chemical Products

12.4.5 Analysis of Semiconductor Electronics. 12.4.5.1 Ultra-Trace Analysis on Si Wafers with VPD

12.4.5.2 Depth Profile Analysis by Etching

13 Nonhomogeneous Samples

13.1 Measurement Modes

13.2 Instrument Requirements

13.3 Data Evaluation

14 Coating Analysis. 14.1 Analytical Task

14.2 Sample Handling

14.3 Measurement Technology

14.4 The Analysis Examples of Coated Samples

14.4.1 Single-Layer Systems: Emission Mode

14.4.2 Single-Layer Systems: Absorption Mode

14.4.3 Single-Layer Systems: Relative Mode. 14.4.3.1 Analytical Problem

14.4.3.2 Variation of the Specified Working Distance

14.4.3.3 Sample Size and Spot Size Mismatch

14.4.3.4 Non-detectable Elements in the Layer: NiP Layers

14.4.4 Characterization of Ultrathin Layers

14.4.5 Multilayer Systems. 14.4.5.1 Layer Systems

14.4.5.2 Measurement Technology

14.4.5.3 Example: Analysis of CIGS Solar Cells

14.4.5.4 Example: Analysis of Solder Structures

14.4.6 Samples with Unknown Coating Systems

14.4.6.1 Preparation of Cross Sections

14.4.6.2 Excitation at Grazing Incidence with Varying Angles

14.4.6.3 Measurement in Confocal Geometry

15 Spot Analyses

15.1 Particle Analyses. 15.1.1 Analytical Task

15.1.2 Sample Preparation

15.1.3 Analysis Technology

15.1.4 Application Example: Wear Particles in Used Oil

15.1.5 Application Example: Identification of Glass Particles by Chemometrics

15.2 Identification of Inclusions

15.3 Material Identification with Handheld Instruments. 15.3.1 Analytical Tasks

15.3.2 Analysis Technology

15.3.3 Sample Preparation and Test Conditions

15.3.4 Analytical Accuracy

15.3.5 Application Examples. 15.3.5.1 Example: Lead in Paint

15.3.5.2 Example: Scrap Sorting

15.3.5.3 Example: Material Inspection and Sorting

15.3.5.4 Example: Precious Metal Analysis

15.3.5.5 Example: Prospecting and Screening in Geology

15.3.5.6 Example: Investigation of Works of Art

15.4 Determination of Toxic Elements in Consumer Products: RoHS Monitoring

15.4.1 Analytical Task

15.4.2 Analysis Technology

15.4.3 Analysis Accuracy

15.5 Toxic Elements in Toys: Toys Standard. 15.5.1 Analytical Task

15.5.2 Sample Preparation

15.5.3 Analysis Technology

16 Analysis of Element Distributions. 16.1 General Remarks

16.2 Measurement Conditions

16.3 Geology. 16.3.1 Samples Types

16.3.2 Sample Preparation and Positioning

16.3.3 Measurements on Compact Rock Samples

16.3.3.1 Sum Spectrum and Element Distributions

16.3.3.2 Object Spectra

16.3.3.3 Treatment of Line Overlaps

16.3.3.4 Maximum Pixel Spectrum

16.3.4 Thin Sections of Geological Samples

16.4 Electronics

16.5 Archeometric Investigations. 16.5.1 Analytical Tasks

16.5.2 Selection of an Appropriate Spectrometer

16.5.3 Investigations of Coins

16.5.4 Investigations of Painting Pigments

16.6 Homogeneity Tests. 16.6.1 Analytical Task

16.6.2 Homogeneity Studies Using Distribution Analysis

16.6.3 Homogeneity Studies Using Multi-point Measurements

17 Special Applications of the XRF. 17.1 High-Throughput Screening and Combinatorial Analysis

17.1.1 High-Throughput Screening

17.1.2 Combinatorial Analysis for Drug Development

17.2 Chemometric Spectral Evaluation

17.3 High-Resolution Spectroscopy for Speciation Analysis. 17.3.1 Analytical Task

17.3.2 Instrument Technology

17.3.3 Application Examples. 17.3.3.1 Analysis of Different Sulfur Compounds

17.3.3.2 Speciation of Aluminum Inclusions in Steel

17.3.3.3 Determination of SiO2 in SiC

18 Process Control and Automation. 18.1 General Objectives

18.2 Off-Line and At-Line Analysis. 18.2.1 Sample Supply and Analysis

18.2.2 Automated Sample Preparation

18.3 In-Line and On-Line Analysis

19 Quality Management and Validation. 19.1 Motivation

19.2 Validation

19.2.1 Parameters

19.2.2 Uncertainty

Appendix A Tables

Appendix B Important Information. B.1 Coordinates of Main Manufacturers of Instruments and Preparation Tools

B.2 Main Suppliers of Standard Materials

B.2.1 Geological Materials and Metals

B.2.2 Stratified Materials

B.2.3 Polymer Standards

B.2.4 High Purity Materials

B.2.5 Precious Metal Alloys

B.3 Important Websites. B.3.1 Information About X-Ray Analytics and Fundamental Parameters

B.3.2 Information About Reference Materials

B.3.3 Scientific Journals

B.4 Laws and Acts, Which Are Important for X-Ray Fluorescence. B.4.1 Radiation Protection

B.4.2 Regulations for Environmental Control

B.4.3 Regulations for Performing Analysis

B.4.4 Use of X-ray Fluorescence for the Chemical Analysis. B.4.4.1 General Regulations

B.4.4.2 Analysis of Minerals

B.4.4.3 Analysis of Oils, Liquid Fuels, Grease

B.4.4.4 Analysis of Solid Fuels

B.4.4.5 Coating Analysis

B.4.4.6 Metallurgy

B.4.4.7 Analysis of Electronic Components

References

Index

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Отрывок из книги

Michael Haschke

Jörg Flock

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A special application for X-ray spectrometry is the analysis of layered materials. Here, we have special analytical conditions, that are reflected in the measurement equipment as well as in the evaluation routines. The measurements are carried out usually on finished products, on which layers have been applied for decorative or functional purposes. This means that the samples are rarely flat and homogeneous over a large area, as it is necessary for conventional XRF. Therefore, the analysis must be carried out on small sample areas. This requires collimation of the exciting beam, thereby reducing the excitation intensity. The intensity loss associated with collimation must be compensated by large solid angles for the detection of the fluorescence radiation. Therefore, mostly ED instruments are used for coating thickness measurements. The associated loss of spectroscopic performance is acceptable, since layer systems usually contain only a few elements that are even known, since this analysis is usually carried out as quality control of the coating process.

Figure 2.10 Analyst 0700 from KEVEX.

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