Читать книгу Encyclopedia of Glass Science, Technology, History, and Culture - Группа авторов - Страница 191

In these techniques, one determines the individual contributions to the TSF by each of the scattering atom pairs by using sharp changes in the X‐ray scattering factor of an element near its X‐ray absorption edge. The data are qualitatively similar to those of extended X‐ray absorption fine structure spectroscopy (EXAFS), but also include low‐k contributions that contain information on the intermediate‐range structure. Scattering data are collected at two or more different energies, one of them being close to the X‐ray absorption edge of the element of interest. With AWAXS and DAXS, the idea is to cancel the correlations that do not involve the element of interest. This is also true for isotope‐substituted diffraction.