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References

Оглавление

1 Abernethy, R.B. (2000). The New Weibull Handbook 5e. North Palm Beach, FL: R.B. Abernethy.

2 Allen, G. and Jarman, R. (1999). Collaborative R and D. New York: Wiley and Sons.

3 Ireson, W. and Coombs, C. (1989). Handbook of Reliability Engineering and Management. New York: McGraw Hill.

4 Morgan, L. (2015). 7 common biases that skew big data results. Information Week.

5 Nuzzo, R. (2015). How scientists fool themselves ‐ and how they can stop. Nature 526: 182‐185. doi: 10.1038/526182a.

6 O'Connor, P. (2012). Practical Reliability Engineering. New York: Wiley and Sons.

7 Porta, M. (2014). A dictionary of epidemiology. Oxford University Press.

8 Tinsley, C.H., Dillon, R.L., and Madsen, P.M. (2011). How to avoid catastrophe. Harvard Business Review. https://hbr.org/2011/04/how-to-avoid-catastrophe.

9 Tulkoff, C. (2017). How reliable is your reliability data? Global SMT and Packaging Magazine.

10 Wunderle, B. and Michel, B. (2006). Progress in reliability research in the micro and nano region. Microelectronics and Reliability 46 (9): 11.

11 Wunderle, B. and Michel, B. (2007). Printed circuit board design integrity: The key to successful PCB development. http://new.marketwire.com/2.0/rel.jsp?id=730231.

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