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Modern Characterization of Electromagnetic Systems and Its Associated Metrology

Tapan K. Sarkar†

Syracuse University 11 Wexford Road, Syracuse, New York 13214

Magdalena Salazar‐Palma

Carlos III University of MadridAvda. de la Universidad 30, 28911 Leganés, Madrid, Spain

Ming Da Zhu

Xidian UniversityNo. 2 South Taibai Road, Xi’an, Shaanxi, China

Heng Chen

Syracuse University211 Lafayette Rd. Room 425, Syracuse, NY, USA




Modern Characterization of Electromagnetic Systems and its Associated Metrology

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