Читать книгу Root Cause Failure Analysis - Trinath Sahoo - Страница 123

Microscopic examination is usually performed in a Scanning Electron Microscope or SEM. A Scanning Electron Microscope is a high‐power magnifying and imaging instrument that uses an accelerated electron beam as a light source. The SEM allows magnifications up to 50 000× and improves depth‐of‐field resolution. A Metallurgical Expert can examine the fracture surface in the SEM and determine fracture topography while inspecting the origin area for anomalies. It is in the SEM that the Metallurgist can classify the fracture and determine the fracture type. Semi‐quantitative chemical information can also be gathered while in the SEM by Energy Dispersive X‐Ray Analysis.