Читать книгу Applications and Metrology at Nanometer-Scale 2 - Bouchaib Radi, Ghias Kharmanda, Michel Ledoux - Страница 7
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Reliability of Multiphysical Systems Set
coordinated by
Abdelkhalak El Hami
Volume 10
Applications and Metrology at Nanometer Scale 2
Measurement Systems, Quantum Engineering and RBDO Method
Pierre Richard Dahoo
Philippe Pougnet
Abdelkhalak El Hami
