Читать книгу Design for Excellence in Electronics Manufacturing - Cheryl Tulkoff - Страница 24

Dynamic black box testing is an empirical, observational evaluation of inputs and outputs to a device that contains the embedded software or runs a transferable software program. The testing is performed with the device functioning while connected to either a system simulator or a test bench in real time (i.e. dynamic mode). This evaluation is solely based on I/O observation as a result of input stimulation and a combination of I/O states. It is performed without knowledge of how the device works or what the device is doing to process the I/O. It is a basic confirmation of individual CTS functional requirements.