Читать книгу X-Ray Fluorescence in Biological Sciences - Группа авторов - Страница 28

We have discussed a few analytical techniques including XRF and μ‐XRF used for the elemental characterization of materials. A concise visual chart has been included, from the literature sources for the reference, for most of the analytical techniques to compare the detection limits and analytical resolutions for materials characterization. Some important parameters that distinguish the analytical capabilities of the techniques such as elemental range, imaging possibility, depth resolution, and instrumental effort is summarized for better understanding. We have briefly discussed a comparative point of views for few analytical techniques (LIBS, XRF, LA‐ICP‐MS, SEM‐EDS, PIXE) and possibilities for their combination (XRD, SEM‐EDS, LIBS, Raman spectroscopy) for better analysis of materials. Differences among the analytical techniques such as LIBS, XRF, Micro‐XRF, LA‐ICP‐MS, and SEM‐EDS are discussed in terms of detection limit, elemental detection range, spatial and depth resolution, sample handling, experimental conditions, sample stress, and excitation sources. The advantages and limitations of some of the techniques are also elaborated.