Читать книгу X-Ray Fluorescence in Biological Sciences - Группа авторов - Страница 45

The main studies were carried out with the TXRF spectrometer S2 PICOFOX (Bruker, Germany) with a 50 W X‐ray tube and Mo‐anode, multilayer monochromator (Ni/C), and silicon‐drift detector (SDD) with energy resolution ~150 eV. Measurements of analytical line intensities for all elements were performed at 50 kV X‐ray tube voltage and 500 μA current. The material prepared for analysis was applied to quartz substrates. All measurements are made in air.

A S4 Pioneer (Bruker, Germany) WD X‐ray spectrometer with a power of up to 4 kW with a Rh anode and a 75 μm thickness Be window was used. When the atoms P, S, Cl, and K were excited, the voltage on the X‐ray tube was 30 kV, the current was 60 mA, and the measurement time was twenty seconds. In time measurement the intensity of the analytical Kα lines of Ca, Ti, Mn, Fe, Ni, Cu, Zn, Rb, Sr, and Lα for Ba, a voltage of 50 kV and a current strength of 40 mA was used. The signal recording time for Ca, Mn, Fe, and Sr was twenty seconds, for Ba ‐ fourty seconds and for the remaining elements ‐ thirty seconds. The analyzing crystals used were PET for P, S, and Cl, and LiF 200 for the remaining elements. All measurements were made in a vacuum.