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Now the question arises: How can XRF be made suitable for trace element determinations? The answer is: by removing the limiting factors stated above. This can be done by taking care of the problems mentioned above: (i) minimizing the spectral background, (ii) making the matrix effects negligible and (iii) reducing the distance between the sample and detector to the minimum possible level. All these features can be achieved in total reflection X‐ray fluorescence (TXRF) spectrometric analysis, which is comparatively a new and advanced version of EDXRF. The possibility of using TXRF for trace elemental determinations was put forward by two Japanese scientists, Y. Yoneda and T. Horiuchi in the year 1971. They proposed that the total reflection of the exciting beam on optically flat supports reduces the background drastically and results in much improved detection limits for a thin film of Cr placed on it when excited by X‐ray beam in TXRF conditions. TXRF is now considered as a distinct X‐ray spectrometric technique [4–8].