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1.5 Scope of This Book
ОглавлениеIn Chapters 2–5, fundamentals of ferroelectrics, applications of ferroelectric materials, recent advances, and advanced measurement and testing techniques in ferroelectrics will be introduced. In particular, device applications of ferroelectric materials in thin film form will be introduced including FeRAM, ferroelectric tunneling‐based resistive switching, etc. The recent advances include ferroelectricity in emerging materials such as 2D materials and high‐k gate dielectric material HfO2, while the advanced characterization technologies include the piezoresponse force microscopy (by imaging and switching ferroelectric domains) and Cs‐corrected transmission electron microscopy (TEM) where atomic level ionic displacement can be identified.
As the most important property application of ferroelectric materials, fundamentals of piezoelectric physics and engineering considerations for device design and fabrication are introduced in Chapters 6 and 7.
In Chapter 8, starting with a brief introduction on origin of ferromagnetism and its analogy to ferroelectrics, device applications, particularly for magnetostrictive devices, are introduced.
Chapters 9 and 10 will introduce the multiferroics of materials possessing both ferromagnetic and ferroelectric orders including single phase and composite materials. In particular, devices based on the integration of ferroelectric and ferromagnetic materials such as multiferroic memory device and ME coupling device for sensor applications will be introduced.
In Chapter 11, ferroelastic materials represented by SMA and magnetic SMAs as well as their device applications will be introduced.