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1.2.3 Zero Defects – Vision of Industry 4.1

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Since the late 1960s, ZD has been one of the quality‐improvement objectives for accomplishing manufacturing quality [57]. Through prevention methods, ZD aims to boost production and minimize waste. ZD is based on the concept that the amount of mistakes a worker makes doesn't matter since inspectors will catch them before they reach customers [57].

Industry 4.0, since its first presentation at the Hannover Messe 2014, is set to be one of the new manufacturing objectives and, most of all, keep the faith of achieving nearly ZD state in the manufacturing industry [58, 59]. The current Industry 4.0 related technologies emphasize on productivity improvement but not on quality enhancement; in other words, they can only keep the faith of achieving nearly ZD state without realizing this goal. The key reason for this inability is the lack of an affordable online and real‐time Total Inspection technology. By adopting the Automatic Virtual Metrology (AVM) technology that has been certified with the invention patents from six countries (Taiwan ROC, USA, Japan, Germany, China, and Korea) developed by the research team of Fan‐Tien Cheng, the Editor and main author of this book, ZD can be achieved as AVM can provide the Total Inspection data of all products online and in real time. A defective product will be discarded once it is detected by AVM; in this way, all of the deliverables will be ZD. Further, the Key‐variable Search Algorithm (KSA) of the Intelligent Yield Management (IYM) system developed by Fan‐Tien Cheng’s research team can be utilized to find out the root causes of the defects for continuous improvement on those defective products. As such, ZD of all products can be achieved. Therefore, once AVM and IYM are integrated into the successfully developed Industry 4.0 platform, the state of ZD can be realized, which is defined as Industry 4.1 by Fan‐Tien Cheng. The concepts of Industry 4.1 were disclosed in IEEE Robotics and Automation Letters in January 2016 [60]. The technical details of AVM and IYM will be elaborated in Chapters 8 and 10, respectively.

Industry 4.1

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