Читать книгу Nano-Technological Intervention in Agricultural Productivity - Javid A. Parray - Страница 25

To understand the elementary composition with a rough idea of per cent weight, a usually fixed field emission scanning electron microscopy (FE‐SEM) or TEM system is commonly used. The electron beam centred on a single NP through SEM or TEM through the software functions to obtain the insight knowledge under observation from the NP. NP consists of constituent elements and, by irradiating electron beams, each of these releases X‐ray energy characteristics. The real X‐ray intensity is directly proportional to the explicit part of the particle's concentration. Researchers in preparatory materials commonly use this technique to help SEM and other processes to validate their components [48]. The elemental composition of ultra–sonochemically synthesized BiVO₄ NPs in pseudo‐flower form [49] was calculated using the EDX technique. Similarly, a similar approach was used to perform the indispensable confirmation and graphene impregnation of Ln₂O₃/graphene heterostructure NPs, which showed C, Ln, and O as contributing elements synthesized by the traditional hydrothermal method [50].