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It is a surface‐sensitive tool and can be used to consider the overall composition and the compositional variance with in‐depth profiling studies. XPS is based on the basic principles of spectroscopy. The typical XPS spectrum consists of the number of electrons on the Y‐axis plot versus the X‐axis electrons' binding energy (eV). Each element has its fingerprint value for energy binding and thus gives a particular set of XPS peaks. Corresponding peaks, such as 1s, 2s, 2p, and 3s, come from the electronic configuration [51]. To research the dispersion of Boron NPs (10 nm size) during functionalization with polyethylene glycol (PEG), a depth profile analysis was given with Ar⁺ ions at 1.4 keV and 20 nm. It has been shown that the concentration of NPs increases from 2% to 5% with depth. This offered strong evidence that within the bulk of functionalized PEG, boron NPs are effectively dissolved [52]. In a related analysis, core–shell Au/Ag showed similar behaviour through XPS scope profiling [53].