Читать книгу Accelerated Life Testing of One-shot Devices - Narayanaswamy Balakrishnan - Страница 10

Lifetime information obtained from one‐shot devices is very limited as the entire data are either left‐ or right‐censored. For this reason, the analysis of one‐shot device testing data poses a special challenge. This book provides several statistical inferential methods for analyzing one‐shot device lifetime data obtained from accelerated life‐tests and also develops optimal designs for two mainstream accelerated life‐tests – constant‐stress and step‐stress accelerated life‐tests – that are commonly used in reliability practice. The discussions provided in the book would enable reliability practitioners to better design their experiments for data collection from efficient accelerated life‐tests when there are budget constraints in place. This is important from estimation and prediction point of view as such optimal designs would result in as accurate an inference as possible under the constraints imposed on the reliability experiment. Moreover, R codes are presented within each chapter so that users can try out performing their own analysis on one‐shot device testing data.

In addition, the inferential methods and the procedures for planning accelerated life‐tests discussed in this book are not only limited to one‐shot devices alone but also can be extended naturally to accelerated life‐tests with periodic inspections (interval‐censoring) and those with continuous monitoring and censoring (right‐censoring). The book finally concludes by highlighting some important issues and problems that are worth considering for further research. This may be especially useful for research scholars and new researchers interested in taking on this interesting and challenging area of research in reliability theory and practice.

It is possible that some pertinent results or references got omitted in this book, and we assure you that it is due to inadvertency on our part and not due to scientific antipathy. We will appreciate greatly if the readers inform us of any corrections/omissions, or any comments pertinent to any of the discussions in the book!

Our sincere thanks go to the entire Wiley team, Ms. Mindy Okura‐Marszycki, Ms. Kathleen Santoloci, and Mr. Brett Kurzman, for taking great interest in this project from day one, for all their help and encouragement during the whole course, and for their fine assistance during the final production stage of the book. Our thanks also go to our research collaborators and graduate students for their incisive comments and queries, which always benefited us greatly and helped clarify some of our own ideas! We express our sincere appreciation to Ms. Elena Maria Castilla Gonzalez, a doctoral student of Professor Leandro Pardo in the Department of Statistics and Operations Research at Complutense University of Madrid, Spain, for her careful reading of Chapter 5 and also for sharing with us some R codes that she had developed concerning robust inferential methods for one‐shot device test analyses. Last but not least, our special thanks go to our families for their patience and understanding, and for providing constant support and encouragement during our work on this book!

Finally, the first author (NB) wishes to state to his older daughter, Ms. Sarah Balakrishnan, that though she lost out on getting his Volvo car due to a major car accident, she should be heartened by the fact that the accident resulted in the germination of his interest and ideas on one‐shot devices (airbags), and ultimately this book solely dedicated to the topic!

July, 2020

Narayanaswamy Balakrishnan

Man Ho Ling

Hon Yiu So