Читать книгу Accelerated Life Testing of One-shot Devices - Narayanaswamy Balakrishnan - Страница 16

Zelen (1959) presented data from a life‐test of glass capacitors at four higher‐than‐usual levels of temperature and two levels of voltage. At each of the eight combinations of temperature and voltage, eight items were tested. We adopt these data to form one‐shot device testing data by taking the inspection times (hours) as which are summarized in Table 1.2. These data were then used to estimate the mean lifetime of glass capacitors for 250 V and 443 K temperature.