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This first edition first published 2021

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Library of Congress Cataloging‐in‐Publication Data

Names: Balakrishnan, Narayanaswamy., 1956‐ author. | Ling, Man Ho, author. | So, Hon

Yiu, author.

Title: Accelerated life testing of one‐shot devices : data collection and

analysis / Narayanaswamy Balakrishnan, McMaster University, Hamilton,

Canada, Man Ho Ling, The Education University of Hong, Kong, New

Territories, Hong Kong, Hon Yiu So, University of Waterloo, Waterloo,

Canada.

Description: First edition. | Hoboken, NJ, USA : Wiley, 2021. | Includes

bibliographical references and index.

Identifiers: LCCN 2020035725 (print) | LCCN 2020035726 (ebook) | ISBN

9781119664000 (cloth) | ISBN 9781119664017 (adobe pdf) | ISBN

9781119663942 (epub)

Subjects: LCSH: Accelerated life testing. | Failure analysis (Engineering)

Classification: LCC TA169.3 .B35 2021 (print) | LCC TA169.3 (ebook) | DDC

620/.00452–dc23

LC record available at https://lccn.loc.gov/2020035725

LC ebook record available at https://lccn.loc.gov/2020035726

Cover Design: Wiley

Cover Image: © Piergiov/Getty Images