Читать книгу Accelerated Life Testing of One-shot Devices - Narayanaswamy Balakrishnan - Страница 15

Fan et al. (2009) considered data, presented in Table 1.1, on 90 electro‐explosive devices under various levels of temperature at different inspection times. Ten devices under test at each condition were inspected to see whether there were any failures or not at each inspection time for each temperature setting. These data were then used to estimate the reliability of electro‐explosive devices at different mission times under the normal operating temperature.

Table 1.1 Failure records on electro‐explosive devices under CSALTs with temperature (K).

Source: Fan et al. (2009).

Test group	Inspection time	Temperature	Number of samples	Number of failures
1	10	308	10	3
2	10	318	10	1
3	10	328	10	6
4	20	308	10	3
5	20	318	10	5
6	20	328	10	7
7	30	308	10	7
8	30	318	10	7
9	30	328	10	9