Читать книгу Accelerated Life Testing of One-shot Devices - Narayanaswamy Balakrishnan - Страница 12

One‐shot device testing data analyses have recently received great attention in reliability studies. The aim of this chapter is to provide an overview on one‐shot device testing data collected from accelerated life‐tests (ALTs). Section 1.2 surveys typical examples of one‐shot devices and associated tests in practical situations. Section 1.3 describes several popular ALTs, while Section 1.4 provides some examples of one‐shot device testing data that are typically encountered in reliability and survival studies. Finally, Section 1.5 details some recent developments on one‐shot device testing data analyses and associated issues of interest.