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Table of Contents

Оглавление

Cover

Title Page

Copyright

Dedication

Preface

About the Companion Website

Chapter 1: One‐Shot Device Testing Data 1.1 Brief Overview 1.2 One‐Shot Devices 1.3 Accelerated Life‐Tests 1.4 Examples in Reliability and Survival Studies 1.5 Recent Developments in One‐Shot Device Testing Analysis

Chapter 2: Likelihood Inference 2.1 Brief Overview 2.2 Under CSALTs and Different Lifetime Distributions 2.3 EM‐Algorithm 2.4 Interval Estimation 2.5 Simulation Studies 2.6 Case Studies with R Codes

Chapter 3: Bayesian Inference 3.1 Brief Overview 3.2 Bayesian Framework 3.3 Choice of Priors 3.4 Simulation Studies 3.5 Case Study with R Codes

10  Chapter 4: Model Mis‐Specification Analysis and Model Selection 4.1 Brief Overview 4.2 Model Mis‐Specification Analysis 4.3 Model Selection 4.4 Simulation Studies 4.5 Case Study with R Codes

11  Chapter 5: Robust Inference 5.1 Brief Overview 5.2 Weighted Minimum Density Power Divergence Estimators 5.3 Asymptotic Distributions 5.4 Robust Wald‐type Tests 5.5 Influence Function 5.6 Simulation Studies 5.7 Case Study with R Codes

12  Chapter 6: Semi‐Parametric Models and Inference 6.1 Brief Overview 6.2 Proportional Hazards Models 6.3 Likelihood Inference 6.4 Test of Proportional Hazard Rates 6.5 Simulation Studies 6.6 Case Studies with R Codes

13  Chapter 7: Optimal Design of Tests 7.1 Brief Overview 7.2 Optimal Design of CSALTs 7.3 Optimal Design with Budget Constraints 7.4 Case Studies with R Codes 7.5 Sensitivity of Optimal Designs

14  Chapter 8: Design of Simple Step‐Stress Accelerated Life‐Tests 8.1 Brief Overview 8.2 One‐Shot Device Testing Data Under Simple SSALTs 8.3 Asymptotic Variance 8.4 Optimal Design of Simple SSALT 8.5 Case Studies with R Codes

15  Chapter 9: Competing‐Risks Models 9.1 Brief Overview 9.2 One‐Shot Device Testing Data with Competing Risks 9.3 Likelihood Estimation for Exponential Distribution 9.4 Likelihood Estimation for Weibull Distribution 9.5 Bayesian Estimation 9.6 Simulation Studies 9.7 Case Study with R Codes

16  Chapter 10: One‐Shot Devices with Dependent Components 10.1 Brief Overview 10.2 Test Data with Dependent Components 10.3 Copula Models 10.4 Estimation of Dependence 10.5 Simulation Studies 10.6 Case Study with R Codes

17  Chapter 11: Conclusions and Future Directions 11.1 Brief Overview 11.2 Concluding Remarks 11.3 Future Directions

18  Appendix A: Derivation of

19  Appendix B: Observed Information Matrix

20  Appendix C: Non‐Identifiable Parameters for SSALTs Under Weibull Distribution

21  Appendix D: Optimal Design Under Weibull Distributions with Fixed

22  Appendix E: Conditional Expectations for Competing Risks Model Under Exponential Distribution

23  Appendix F: Kendall's Tau for Frank Copula

24  Bibliography

25  Author Index

26  Subject Index

27  End User License Agreement

Accelerated Life Testing of One-shot Devices

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